R.A.M. - Realtime Application Measurement GmbH

The FIS 1000 inspection system is optimized for the detection of flaws in films. This highly reliable, powerful inspection system interface, errors can be detected on web materials having widths between 50 mm and 10 m. The FIS 1000 inspection system detects classifies and documents the optical errors on or in films.
As programmable adaptive LED line lights are available for transmitted light, bright field, dark field or incident light. The flaws are automatically classified in error classes such as specks / gels, burns, fisheye, impurities, wrinkles, holes or flies.
The images of these faults are stored for further evaluation. Any number of fault classes and sizes can be defined.
This "high-end system" is able to clearly distinguish and identify faults. The operator can typify errors based on error patterns and sort by class. The classifier then determines automatically the inspection parameters for each error.
Different user specified widths can be specified. These widths can then be assigned to different orders.
The FIS 1000 has digital inputs (e.g. for reel change signal, encoder signal or inspection stop signal) and digital outputs (e.g. controlling the alarm lamp for critical errors and a certain number of errors per m², machine stop).

In the light of Industry 4.0, R.A.M. GmbH interlinks machines and sensors in the "plastPMS" system. The user gets access to all production parameters and can intervene directly in the process. The correlation of previously independent data offers completely new ways of quality optimisation.
The "plastPMS" system offers everything at a glance. Sophisticated mathematical algorithms help map the process virtually (Big Data), optimise it and reapply it.

Benefits:
- Higher effectiveness of all systems
- Waste reduction / plastic waste reduction
- Optimal use of resources
- Improved machine utilisation
- Quality improvement
- Increase in production
- Minimisation / reduction of the use of plastics

Sophisticated data mining algorithms identify patterns in big data and thus acquire completely new insights and coherences. Thus, mistakes are corrected before they appear.

plastPMS = plastic production monitoring system

The inspection system designed as a laboratory bench, classifies, documents and records optical defects on or in film samples (DIN A 4 / DIN A 3) with transmitted light illumination for transparent and opaque films. For a better recognition of gel specks in transparent film a dark-field aperture can be inserted. An option for collateral films (specular angle on the top and/or on the bottom) is a combination of transmitted and reflected light illumination. The defects are automatically classified in defect classes such as gel specks, gels, burners, fisheyes, impurities, wrinkles, voids or flies. Photos of these defects are available for further evaluation. 

ITG 500 Bench System can be easily integrated in your IT network via Network interfaces. The Evaluation can be tracked from every single working place. Furthermore the data can also be download via the local USB interface.

We can supply the widest range of on-line film thickness measurement and control solutions for blown film, cast film, biax film and sheet. This includes barrier layer thickness measurements for multi-layer films.
Due to our uniquely wide range of sensor technologies available, it can provide true consultative recommendations to its customers offering the most appropriate gauging solution for its customers’ applications.
Our on-line film and sheet measurement systems are available for a wide range of web widths, machine speeds and product thicknesses. In addition, our machine direction and advanced profile controls (APC) plus its full suite of HMI reports help provide superior product quality and significantly reduced scrap.
Measurement techniques include:

• Infrared transmission
• Beta transmission
• X-ray transmission
• X-ray backscatter
• Gamma backscatter

From microns to millimeters, our film thickness gauges are recognized worldwide for their accuracy, stability and reliability.